KAVITHA, R; VISHNUPRIYA, R. An Efficient Approach for Test Pattern Generation in Scan Based BIST. International Journal of Industrial Engineering, [S. l.], v. 1, n. 7, p. 214–220, 2017. DOI: 10.65000/y6ew3e37. Disponível em: https://gjpublications.com/index.php/IJIE/article/view/91. Acesso em: 22 mar. 2026.